Impact Ionisation Group Conference Publications

A selection of conference papers by the Impact Ionisation Group can be found below. We are working to add many more papers in the near future.

2009

Development of LWIR photodiodes based on InAs GaSb Type II strained layer

  • EMRS-DTC 6th Annual Technical Conference & Exhibition
  • 7th - 8th July 2009
  • S. D Das, S. L. Tan, Y. L. Goh, S. Zhang, C. H. Tan, J. P. R David
  • publisher's page, full paper

2008

Optimization of InP APDs for high-speed lightwave systems

  • 20th International Conference on Indium Phosphide and Related Materials
    • Versailles, FRANCE, May 25-29, 2008
  • Published in in Indium Phosphide and Related Materials, 2008. IPRM 2008, 20th International Conference on
    • Pages 1-4, 25-29 May 2008
  • Ong, D.S.G. Ng, J.S. David, J.P.R. Hayat, M.M. Sun, P.
  • abstract

Design considerations for In0.52Al0.48As based avalanche photodiodes

  • Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on
  • 25-29 May 2008
  • Liew Tat Mun, S.C. Tan, C.H. Marshall, A. Goh, Y.L. Tan, L. David, J.
  • abstract

Dark current mechanisms in bulk GaInNAs photodiodes

  • Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on
  • 25-29 May 2008
  • Soong, W.M. Ng, J.S. Steer, M.J. Hopkinson, M. David, J. Chamings, J. Sweeney, S.J. Adams, A.R. Allam, J.
  • abstract

Temperature Dependence of Hole Impact Ionization Coefficient in 4H-SiC Photodiodes

  • 7th European Conference on Silicon Carbide and Related Materials, Barcelona, SPAIN, SEP 07-11, 2008
  • Published in: Materials Science Forum (Volumes 615 - 617),
  • Volume: SILICON CARBIDE AND RELATED MATERIALS 2008, Pages:311-314
  • W.S. Loh, J.P.R. David, B.K. Ng, Stanislav I. Soloviev, Peter M. Sandvik, J.S. Ng, C. Mark Johnson
  • abstract

Impact Ionization in Ion Implanted 4H-SiC Photodiodes

  • Conference on Silicon Carbide - Materials, Processing and Devices held at the 2008 MRS Spring Meeting San Francisco, CA, MAR 25-27, 2008
  • Published in: Materials Research Society Symposium D
  • Volume 1069: Silicon Carbide 2008ÁMaterials, Processing and Devices
  • Wei Sun Loh, Eric Z. J. Goh, Konstantin Vassilevski, Irina Nikitina, John P. R. David, Nick G. Wright, C. Mark Johnson
  • abstract

2007

Avalanche Multiplication and Impact Ionisation in Separate Absorption and Multiplication 4H-SiC Avalanche Photodiodes

  • International Conference on Silicon Carbide and Related Materials, Otsu, JAPAN, OCT 14-19, 2007
  • Published in: Materials Science Forum (Volumes 600 - 603)
  • Volume: Silicon Carbide and Related Materials 2007, Pages: 1207-1210
  • W.S. Loh, J.P.R. David, Stanislav I. Soloviev, H.Y. Cha, Peter M. Sandvik, J.S. Ng, C. Mark Johnson
  • abstract

Effects of spacer growth temperature on the optical properties of quantum dot laser structures

  • Conference on Device and Process Technologies for Microelectronics, MEMS, Photonics and Nanotechnology IV Canberra, AUSTRALIA, DEC 05-07, 2007
  • Proc. SPIE, Vol. 6800
  • N. F. Hasbullah, J. S. Ng, H. Y. Liu, M. Hopkinson, J. P. R. David, T. J. Badcock, D. J. Mowbray, A. M. Sanchez, R. Beanland
  • abstract

Fabrication of InAs photodiodes with reduced surface leakage current

  • Conference on Optical Materials in Defence Systems Technology IV, Florence, ITALY, SEP 17-18, 2007
  • Proc. SPIE, Vol. 6740
  • Andrew R. J. Marshall, Chee Hing Tan, John P. R. David, Jo Shien Ng, and Mark Hopkinson
  • abstract

Temperature dependence of breakdown voltage of InP and InAlAs avalanche photodiodes

  • Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
  • 21-25 Oct. 2007, pages: 513 - 514
  • Ng, J.S. Tan, L.J.J. Ong, D.S.G. Tan, C.H. David, J.P.R.
  • abstract

Impact ionization of sub-micron InP structures

  • Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
  • 21-25 Oct. 2007, pages: 515 - 516
  • Tan, L.J.J. Ng, J.S. Tan, C.H. David, J.P.R.
  • abstract

The effects of monolayer thickness and sheet doping density on dark current and noise current in quantum dot infrared photodetectors

  • Conference on Optical Materials in Defence Systems Technology IV, Florence, ITALY, SEP 17-18, 2007
  • Published in: Proc. SPIE, Vol. 6740
  • Chee Hing Tan, Souye C. Liew Tat Mun, Peter Vines, John P. R. David, Mark Hopkinson, Luke Wilson, and Pantelis Aivaliotis
  • abstract

Extremely low excess noise InAlAs avalanche photodiodes

  • Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
  • 14-18 May 2007, page(s): 81 - 83
  • Tan, C.H. Goh, Y.L. Marshall, A.R.J. Tan, L.J.J. Ng, J.S. David, J.P.R.
  • abstract

InP-Based Avalanche Photodiodes with > 2.1Ám Detection Capability

  • Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
  • 14-18 May 2007, page(s): 293 - 295
  • Goh, Y.L. Ng, J.S. Tan, C.H. David, J.P.R. Sidhu, R. Holmes, A.L. Campbell, J.C.
  • abstract

Temperature Dependence of InP-Based Avalanche Photodiodes

  • Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
  • 14-18 May 2007, pages: 296 - 298
  • Ong, D.S.G. Ng, J.S. Tan, L.J.J. Tan, C.H. David, J.P.R.
  • abstract

GaInNAs Lattice-Matched to GaAs for Photodiodes

  • Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
  • 14-18 May 2007, pages: 347 - 349
  • Ng, J.S. Soong, W.M. Steer, M.J. Hopkinson, M. David, J.P.R. Chamings, J. Adams, A.R. Sweeney, S.J. Allam, J.
  • abstract

2006

Determination of Impact Ionization Coefficients Measured from 4H Silicon Carbide Avalanche Photodiodes

  • 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, ENGLAND, SEP, 2006
  • Published in: Materials Science Forum (Volumes 556 - 557)
  • Volume: Silicon Carbide and Related Materials 2006
  • W.S. Loh, C. Mark Johnson, J.S. Ng, Peter M. Sandvik, Steve Arthur, Stanislav I. Soloviev, J.P.R. David
  • abstract

Optimisation of quantum dot infrared photodetectors (QDIPs) for imaging applications

  • Conference on Electro-Optical and Infrared Systems - Technology and Applications III, Stockholm, SWEDEN, SEP 13-14, 2006
  • Published in: Proc. SPIE, Vol. 6395
  • P. Aivaliotis, E. Zibik, L. R. Wilson, J. P. R. David, M. Hopkinson, and C. Groves
  • abstract

Excess Noise and Avalanche Multiplication in InAlAs

  • 19th Annual Meeting of the IEEE-Lasers-and-Electro-Optics-Society, Montreal, CANADA, OCT 29-NOV 02, 2006
  • Published in: 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2, Pages: 787-788
  • Goh, Y.L. Massey, D.J. Marshall, A.R.J. Ng, J.S. Tan, C.H. Hopkinson, M. David, J.P.R.
  • abstract

A Comparison of the Lower Limit of Multiplication Noise in InP and InAlAs Based APDs for Telecommunications Receiver Applications

  • 19th Annual Meeting of the IEEE-Lasers-and-Electro-Optics-Society, Montreal, CANADA, OCT 29-NOV 02, 2006
  • Published in: 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2, Pages: 789-790
  • Marshall, A.R.J. Goh, Y.L. Tan, L.J.J. Tan, C.H. Ng, J.S. David, J.P.R.
  • abstract

A physics-based model to predict bit error rate of an optical telecommunication system incorporating an avalanche photodiode that includes the effects of dead space and finite carrier velocity

  • 19th Annual Meeting of the IEEE-Lasers-and-Electro-Optics-Society, Montreal, CANADA, OCT 29-NOV 02, 2006
  • Published in: 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2, Pages: 859-860
  • Groves, C. David, J.P.R.
  • abstract

2005

Low noise avalanche photodiodes

  • 18th Annual Meeting of the IEEE-Lasers-and-Electro-Optical-Society, Sydney, AUSTRALIA, OCT 22-28, 2005
  • Published in: 2005 IEEE LEOS Annual Meeting Conference Proceedings (LEOS), Pages: 368-369
  • David, J.P.R.
  • abstract

Temperature dependence of avalanche multiplication in submicron silicon devices

  • 35th European Solid-State Device Research Conference, Grenoble, FRANCE, SEP 12-16, 2005
  • Published in: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Pages: 245 - 248
  • Massey, D.J., David, J.P.R., Rees, G.J.
  • abstract